Matthias Jung, Deepak M. Mathew, Carl C. Rheinländer M.Eng., Christian Weis, Norbert Wehn

• The authors explore the intrinsic trade-off in a DRAM between the power consumption (due to refresh) and the reliability. Their unique measurement platform allows tailoring to the design constraints depending on whether power consumption, performance or reliability has the highest design priority. Furthermore, the authors show how this measurement platform can be used for reverse engineering the internal structure of DRAMs and how this knowledge can be used to improve DRAM’s reliability.