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This paper deals with the characterization of microscopically heterogeneous, but macroscopically homogeneous spatial structures. A new method is presented which is strictly based on integral-geometric formulae such as Crofton's intersection formulae and Hadwiger's recursive de nition of the Euler number. The corresponding algorithms have clear advantages over other techniques. As an example of application we consider the analysis of spatial digital images produced by means of Computer Assisted Tomo- graphy.

Wicksell's corpuscle problem deals with the estimation of the size distribution of a population of particles, all having the same shape, using a lower imensional sampling probe. This problem was originary formulated for particle systems occurring in life sciences but its solution is of actual and increasing interest in materials science. From a mathematical point of view, Wicksell's problem is an inverse problem where the interesting size distribution is the unknown part of a Volterra equation. The problem is often regarded ill-posed, because the structure of the integrand implies unstable numerical solutions. The accuracy of the numerical solutions is considered here using the condition number, which allows to compare different numerical methods with different (equidistant) class sizes and which indicates, as one result, that a finite section thickness of the probe reduces the numerical problems. Furthermore, the relative error of estimation is computed which can be split into two parts. One part consists of the relative discretization error that increases for increasing class size, and the second part is related to the relative statistical error which increases with decreasing class size. For both parts, upper bounds can be given and the sum of them indicates an optimal class width depending on some specific constants.

A new method of determining some characteristics of binary images is proposed based on a special linear filtering. This technique enables the estimation of the area fraction, the specific line length, and the specific integral of curvature. Furthermore, the specific length of the total projection is obtained, which gives detailed information about the texture of the image. The influence of lateral and directional resolution depending on the size of the applied filter mask is discussed in detail. The technique includes a method of increasing directional resolution for texture analysis while keeping lateral resolution as high as possible.