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To continue reducing voltage in scaled technologies, both circuit and architecture-level resiliency techniques are needed to tolerate process-induced defects, variation, and aging in SRAM cells. Many different resiliency schemes have been proposed and evaluated, but most prior results focus on voltage reduction instead of energy reduction. At the circuit level, device cell architectures and assist techniques have been shown to lower Vmin for SRAM, while at the architecture level, redundancy and cache disable techniques have been used to improve resiliency at low voltages. This paper presents a unified study of error tolerance for both circuit and architecture techniques and estimates their area and energy overheads. Optimal techniques are selected by evaluating both the error-correcting abilities at low supplies and the overheads of each technique in a 28nm. The results can be applied to many of the emerging memory technologies.
Spätestens seit der in 1999 beschlossenen Bologna-Reform hat die bereits zuvor in Schulen vorangeschrittene Integration überfachlicher Kompetenzen in die Curricula auch die Studiengänge der Hochschulen und Universitäten erreicht (Scholz 2009). In diesem Beitrag wird die Konzeption einer Lehrveranstaltung im Rahmen des Kooperationsprojekts „Selbstlernen im Fachbereichskontext!“ (SELF!PHYSIK) vorgestellt, die die För-derung überfachlicher Kompetenz im Studiengang Physik zum Ziel hat. Als Werkzeug zum Erfahren und Reflektieren überfachlicher Kompetenzen werden Freihandexperimente in Lern- und Lehrsituationen einge-setzt, die kooperatives Problemlösen und fachliches Erklären erfordern.
Der Verbund Norddeutscher Universitäten (VNU) verfolgt u.a. das Ziel der Verbesserung von Studium und Lehre an den Mitgliedsuniversitäten durch universitätsübergreifende Kooperation und Bündelung von Kompetenzen im Bereich der Qualitätssicherung und -entwicklung.In diese projektorientierte Zusammenarbeit reiht sich auch das jüngste Vorhaben ein. An einigen Verbunds-Universitäten wurden bereits Monitoringsysteme entwickelt und erprobt und positive Erfahrungen bezüglich der Einbindung von Studienverlaufsstatistiken in die Prozesse der Studiengang- und Qualitätsentwicklung gemacht. Bislang gab es hierzu jedoch keinen systematischen Austausch und die Vergleichbarkeit der daraus hervorgehenden Kennzahlen und Indikatoren war nicht unmittelbar gegeben, aufgrund der Individualität der entwickelten Verfahren. Vor diesem Hintergrund wurde im Juni 2018 die Arbeitsgruppe Datenmonitoring ins Leben gerufen mit dem Ziel, vor allem den Studienfächern die Möglichkeit zu eröffnen, sich über die Mitgliedsuniversitäten hinweg kennzahlenbasiert miteinander zu vergleichen.
The Power and Energy Student Summit (PESS) is designed for students, young professionals and PhD-students in the field of power engineering. PESS offers the possibility to gain first experience in presentation, publication and discussion with a renowned audience of specialists. Therefore, the conference is accompanied and supervised by established scientists and experts. The venue changes every year. In 2018, the University of Kaiserslautern held the eighth PESS conference. This document presents the submissions of this conference.
Multiple-channel die-stacked DRAMs have been used for maximizing the performance and minimizing the power of memory access in 2.5D/3D system chips. Stacked DRAM dies can be used as a cache for the processor die in 2.5D/3D system chips. Typically, modern processor system-on-chips (SOCs) have three-level caches, L1, L2, and L3. Could the DRAM cache be used to replace which level of caches? In this paper, we derive an inequality which can aid the designer to check if the designed DRAM cache can provide better performance than the L3 cache. Also, design considerations of DRAM caches for meet the inequality are discussed. We find that a dilemma of the DRAM cache access time and associativity exists for providing better performance than the L3 cache. Organizing multiple channels into a DRAM cache is proposed to cope with the dilemma.
The energy efficiency of today’s microcontrollers is supported by the extensive usage of low-power mechanisms. A full power-down requires in many cases a complex, and maybe error prone, administration scheme, because data from the volatile memory have to be stored in a flash based back- up memory. New types of non-volatile memory, e.g. in RRAM technology, are faster and consumes a fraction of the energy compared to flash technology. This paper evaluates power gating for WSN with RRAM as back-up memory.
A counter-based read circuit tolerant to process variation for low-voltage operating STT-MRAM
(2016)
The capacity of embedded memory on LSIs has kept increasing. It is important to reduce the leakage power of embedded memory for low-power LSIs. In fact, the ITRS predicts that the leakage power in embedded memory will account for 40% of all power consumption by 2024 [1]. A spin transfer torque magneto-resistance random access memory (STT-MRAM) is promising for use as non-volatile memory to reduce the leakage power. It is useful because it can function at low voltages and has a lifetime of over 1016 write cycles [2]. In addition, the STT-MRAM technology has a smaller bit cell than an SRAM. Making the STT-MRAM is suitable for use in high-density products [3–7]. The STT-MRAM uses magnetic tunnel junction (MTJ). The MTJ has two states: a parallel state and an anti-parallel state. These states mean that the magnetization direction of the MTJ’s layers are the same or different. The directions pair determines the MTJ’s magneto- resistance value. The states of MTJ can be changed by the current flowing. The MTJ resistance becomes low in the parallel state and high in the anti-parallel state. The MTJ potentially operates at less than 0.4 V [8]. In other hands, it is difficult to design peripheral circuitry for an STT-MRAM array at such a low voltage. In this paper, we propose a counter-based read circuit that functions at 0.4 V, which is tolerant of process variation and temperature fluctuation.
The objective of current research on internal combustion engines
is to further reduce exhaust emissions while simultaneously
reducing fuel consumption. The resulting measures often mean
an increase in complexity of internal combustion engines, which
on one hand increases production cost and on the other hand
increases the susceptibility of the overall system to defects. It is
therefore necessary to develop technologies which can generate
an advantage for the consumer despite increasing complexity.
Within the scope of the project “High Efficiency Diesel Engine
Concept” (“Hocheffizientes Diesel-Motoren-Konzept” HDMK),
funded by the Federal Ministry of Economic Affairs and Energy
with TÜV Rheinland as project management organization
(funding code: 19U15003A), two engine concepts were
investigated and combined on a John Deere four-cylinder inline
engine.
On the one hand, a new cylinder activation concept ("3/4-
cylinder concept") was implemented with the aim of reducing
fuel consumption. On the other hand, a fully variable valve train
was developed for this engine, which both improves the
functionality of the 3/4-cylinder concept and can have a positive
influence on exhaust emissions through internal exhaust gas
recirculation.
A comparison of this engine concept with its series reference
based on measurement data showed a fuel economy advantage
of up to 5.2% in the low load field cycles of the DLG PowerMix.
The maximum fuel consumption benefit in the low load engine
regime exceeded 15% in some of the operating points.
As a final step, the engine was modified for the integration into
an existing and working tractor, maintaining the available
installation space of the powertrain.
In most cases in a safety analysis the influences of security problems are omitted or even forgotten. Because more and more systems are accessible from outside the system via maintenance interfaces, this missing security analysis is becoming a problem. This is why we propose an approach on how to extend the safety analysis by security aspects. Such a more comprehensive analysis should lead to systems that react in less catastrophic ways to attacks.
Component fault trees that contain safety basic events as well as security basic events cannot be analyzed like normal CFTs. Safety basic events are rated with probabilities in an interval [0,1], for security basic events simpler scales such as \{low, medium, high\} make more sense. In this paper an approach is described how to handle a quantitative safety analysis with different rating schemes for safety and security basic events. By doing so, it is possible to take security causes for safety failures into account and to rate their effect on system safety.