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Areal optical surface topography measurement is an emerging technology for industrial quality control. However, neither calibration procedures nor the utilization of material measures are standardized. State of the art is the calibration of a set of metrological characteristics with multiple calibration samples (material measures). Here, we propose a new calibration sample (artefact) capable of providing the entire set of relevant metrological characteristics within only one single sample. Our calibration artefact features multiple material measures and is manufactured with two-photon laser lithography (direct laser writing, DLW). This enables a holistic calibration of areal topography measuring instruments with only one series of measurements and without changing the sample.
The scales of white beetles strongly scatter light within a thin disordered network of
chitin filaments. There is no comparable artificial material achieving such a high scat-
tering strength within a thin layer of low refractive index material. Several analyses
investigated the scattering but could not explain the underlying concept. Here a model
system is described, which has the same optical properties as the white beetles’ scales
in the visible wavelength range. With some modification, it also explains the behavior
of the structures in the near infrared range. The comparison of the original structure and
the model system is done by finite-difference time-domain calculations. The calcula-
tions show excellent agreement with the beetles’ scales with respect to the reflectance,
the time-of-flight, and the intensity distribution in the far-field.