Pattern Recognition Using Measure Space Metrics

  • Patterns are considered as normalized measures and distances between them are defined as distances of the corresponding measures using metrics in measure spaces. This idea can be applied for pattern recognition if smeared patterns have to be compared with given ideal patterns. Different metrics are sensitive to different characteristics of the patterns - this is demonstrated in discussing examples. Particular attention is paid to a problem of Quality Control for an artificial fabric, where the distance to uniformity is defined and evaluated; the results are now used in industry.

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Metadaten
Author:Helmut Neunzert, B. Wetton
URN (permanent link):urn:nbn:de:hbz:386-kluedo-6297
Serie (Series number):Berichte der Arbeitsgruppe Technomathematik (AGTM Report) (28)
Document Type:Preprint
Language of publication:English
Year of Completion:1987
Year of Publication:1987
Publishing Institute:Technische Universität Kaiserslautern
Faculties / Organisational entities:Fachbereich Mathematik
DDC-Cassification:510 Mathematik

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