TY  - CONF
A1  - Jung, Matthias
A1  - Mathew, Deepak M.
A1  - M.Eng., Carl C. Rheinländer
A1  - Weis, Christian
A1  - Wehn, Norbert
T1  - A Platform for Analyzing DDR3 and DDR4 DRAMs
N2  - The authors explore the intrinsic trade-off in a DRAM between the power consumption (due to refresh) and the reliability. Their unique measurement platform allows tailoring to the design constraints depending on whether power consumption, performance or reliability has the highest design priority. Furthermore, the authors show how this measurement platform can be used for reverse engineering the internal structure of DRAMs and how this knowledge can be used to improve DRAM’s reliability.
KW  - DRAM
KW  - Reverse Engineering
KW  - Measurement
Y1  - 2018
UR  - https://kluedo.ub.uni-kl.de/frontdoor/index/index/docId/5283
UR  - https://nbn-resolving.org/urn:nbn:de:hbz:386-kluedo-52834
ER  -